国产做a爱片久久毛片a片,国产精品一久久香蕉国产线看观看,国产极品美女视频福利,亚洲卡一卡二卡三新区隐藏入口

The Contactless Resistivity Tester is a device meant for testing electrical resistance on flat and bubble surfaces of semiconductor ingots. Measuring of the resistivity of the silicon ingots is based on the determination of magnetic energy power losses caused by eddy currents inside the ingot. It enables repidity and contactlessness of measurement and does not require special surface treatment before measurement.

■ Non-contact measurement
■Resistivity measurements by eddy current probe
■No sample preparation
■Application:
  ■multicrystal silicon Ingot/ Block /Wafer
  ■monocrystal silicon Ingot/ Wafer
■Resistivity Range:0.001-100ohm.cm
■Accuracy:2%